THGEM探测器X光斑寻迹和位置分辨实验研究

刘川凤; 周晓娟; 周健荣; 鲁黎明; 朱林; 何聪; 谭莹莹; 许虹; 谢宇广; 王晓冬; 吴金杰; 陈元柏; 孙志嘉

doi:10.11804/NuclPhysRev.35.01.061

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THGEM探测器X光斑寻迹和位置分辨实验研究

刘川凤, 周晓娟, 周健荣, 鲁黎明, 朱林, 何聪, 谭莹莹, 许虹, 谢宇广, 王晓冬, 吴金杰, 陈元柏, 孙志嘉

文章导航 > 原子核物理评论 > 2018 > 35(1): 61-65

刘川凤, 周晓娟, 周健荣, 鲁黎明, 朱林, 何聪, 谭莹莹, 许虹, 谢宇广, 王晓冬, 吴金杰, 陈元柏, 孙志嘉. THGEM探测器X光斑寻迹和位置分辨实验研究[J]. 原子核物理评论, 2018, 35(1): 61-65. doi: 10.11804/NuclPhysRev.35.01.061

引用本文:

LIU Chuanfeng, ZHOU Xiaojuan, ZHOU Jianrong, LU Liming, ZHU Lin, HE Cong, TAN Yingying, XU Hong, XIE Yuguang, WANG Xiaodong, WU Jinjie, CHEN Yuanbo, SUN Zhijia. Research on the X-ray Spot Tracing and the Position Resolution of THGEM Detector[J]. Nuclear Physics Review, 2018, 35(1): 61-65. doi: 10.11804/NuclPhysRev.35.01.061

Citation:

LIU Chuanfeng, ZHOU Xiaojuan, ZHOU Jianrong, LU Liming, ZHU Lin, HE Cong, TAN Yingying, XU Hong, XIE Yuguang, WANG Xiaodong, WU Jinjie, CHEN Yuanbo, SUN Zhijia. Research on the X-ray Spot Tracing and the Position Resolution of THGEM Detector[J]. Nuclear Physics Review, 2018, 35(1): 61-65. doi: 10.11804/NuclPhysRev.35.01.061

THGEM探测器X光斑寻迹和位置分辨实验研究

doi: 10.11804/NuclPhysRev.35.01.061

刘川凤^1,2,3,
周晓娟^1,3,
周健荣^1,3,
鲁黎明^1,3,5,
朱林^1,3,5,
何聪^1,3,5,
谭莹莹^1,3,5,
许虹^1,3,
谢宇广^1,4,
王晓冬⁵,
吴金杰⁶,
陈元柏^1,3,4,
孙志嘉^1,3,4,

1.
中国科学院高能物理研究所, 北京 100049;
2.
东莞材料基因高等理工研究院, 广东东莞 523803;
3.
东莞中子科学中心, 广东东莞 523803;
4.
核探测与核电子学国家重点实验室, 北京 100049;
5.
南华大学核科学技术学院, 湖南衡阳 421000;
6.
中国计量科学研究院, 北京 100029

基金项目: 国家重点研发计划项目（2017YFA0403702）；国家自然科学基金资助项目（11635012，11775243）；广东省引进创新创业团队资助项目（2016ZT06G025）；中国科学院科研装备研制项目（YZ201512）

详细信息

作者简介:
刘川凤(1990-),女,河北石家庄人,硕士研究生,从事气体探测器研究;chuanfeng_liu@163.com

通讯作者: 孙志嘉,Email:sunzj@ihep.ac.cn。

中图分类号: O572.21⁺2

Research on the X-ray Spot Tracing and the Position Resolution of THGEM Detector

LIU Chuanfeng^1,2,3,
ZHOU Xiaojuan^1,3,
ZHOU Jianrong^1,3,
LU Liming^1,3,5,
ZHU Lin^1,3,5,
HE Cong^1,3,5,
TAN Yingying^1,3,5,
XU Hong^1,3,
XIE Yuguang^1,4,
WANG Xiaodong⁵,
WU Jinjie⁶,
CHEN Yuanbo^1,3,4,
SUN Zhijia^{1,3,4
,}

1.
Institute of High Energy Physics Chinese Academy of Sciences, Beijing 10049, China;
2.
Centre of Excellence for Advanced Materials, Dongguan 523808, Guangdong, China;
3.
Dongguan Neutron Science Center, Dongguan 523803, Guangdong, China;
4.
State Key Laboratory of Particle Detection and Electronics, Beijing 100049, China;
5.
School of Nuclear Science and Technology, University of South China, Hengyang 421000, Hunan, China;
6.
National Institute of Metrology, Beijing 100029, China

Funds: National Key R&D Program of China (2017YFA0403702); National Natural Science Foundation of China (11635012, 11775243); Guangdong Innovative and Entrepreneurial Research Team Program (2016ZT06G025); Scientific Instrument Developing Project of Chinese Academy of ScienceS(YZ201512)

摘要: 介绍了一种基于THGEM的X射线光斑寻迹探测器，用于X射线单光子计量技术研究和测量，探测器有效面积200 mm×200 mm，采用128路基于ASIC和FPGA的高速读出电子学，探测器分为中间高分辨区和外围低分辨区两部分，两部分共用一套读出电子学。实验在中国计量科学研究院利用X光机产生的束线，测试光斑位置、光斑精细分布以及探测器的位置分辨。实验结果表明，探测器实现了同时对光斑寻迹和光斑的精细测量，探测器中间高分辨区x方向的位置分辨率为0.63 mm（FWHM），y方向位置分辨率为0.62mm（FWHM），探测器各项性能指标均达到了预期目标。

This paper introduces the detector of X-ray spot tracing based on the THGEM. It is used for X ray single photon measurement technology research and measurement with an effective area of 200 mm×200 mm. The circuit board has 128 array of high speed readout electronics based on ASIC and FPGA. And it is divided into two parts:the middle area of high sensitive and the peripheral area of low sensitive. The two parts share a set of readout electronics. The experiment tests the position and the fine structure of the beam line produced by X ray machine in National Institute of Metrology. The results of the experimental show that the detector realizes both the spot tracing and the fine structure of the spot. The position resolution is 0.63 mm in x direction and 0.62 mm in y direction in high sensitive of the detector, which achieve the desired goal of preliminary design.
- THGEM探测器 /
- 位置分辨 /
- 光斑精细测量 /
- 光斑寻迹
Abstract: This paper introduces the detector of X-ray spot tracing based on the THGEM. It is used for X ray single photon measurement technology research and measurement with an effective area of 200 mm×200 mm. The circuit board has 128 array of high speed readout electronics based on ASIC and FPGA. And it is divided into two parts:the middle area of high sensitive and the peripheral area of low sensitive. The two parts share a set of readout electronics. The experiment tests the position and the fine structure of the beam line produced by X ray machine in National Institute of Metrology. The results of the experimental show that the detector realizes both the spot tracing and the fine structure of the spot. The position resolution is 0.63 mm in x direction and 0.62 mm in y direction in high sensitive of the detector, which achieve the desired goal of preliminary design.
- THGEM detector /
- position resolution /
- spot structure /
- spot tracing

[1]	SAULI F. Nucl Instr Meth A, 1997, 386:531.
[2]	BACHMANN S, BRESSAN A, KAPPLER S, et al. Nucl Instr & Meth A, 2001, 471:971.
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[4]	BADERTSCHER A, KNECHT L, LAFFRANCHI M, et al. Nucl Instr & Meth A, 2010, 617:188.
[5]	WANG Yanfeng, SUN Zhijia, ZHOU Jianrong, et al. SCIENCE CHINA Physics, Mechanics & Astronomy, 2013, 56(10):1897.
[6]	WANG Tuo, ZHOU Jianrong, SUN Zhijia, et al. Nuclear Physics Review, 2014, 31(1):69. (in Chinese) (王拓, 周建荣, 孙志嘉, 等. 原子核物理评论, 2014, 31(1):69.)
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[9]	LI Ke. Experiment Study of Thermal Neutron Detector Based on nTHGEM[D]. Lanzhou:Lanzhou University, 2016:20. (in Chinese) (李科. 基于nTHGEM热中子探测器的实验研究[D]. 兰州:兰州大学, 2016:20.)
[10]	The ROOT Team. The ROOT users guide[M/OL].[2017-12-01]. http://root.cern.ch/Download/doc/User/doc/User_Guide_526.pdf.

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THGEM探测器X光斑寻迹和位置分辨实验研究

doi: 10.11804/NuclPhysRev.35.01.061

1. 中国科学院高能物理研究所, 北京 100049;

2. 东莞材料基因高等理工研究院, 广东东莞 523803;

3. 东莞中子科学中心, 广东东莞 523803;

4. 核探测与核电子学国家重点实验室, 北京 100049;

5. 南华大学核科学技术学院, 湖南衡阳 421000;

6. 中国计量科学研究院, 北京 100029

作者简介:
刘川凤(1990-),女,河北石家庄人,硕士研究生,从事气体探测器研究;chuanfeng_liu@163.com

通讯作者: 孙志嘉,Email:sunzj@ihep.ac.cn。

收稿日期: 2017-11-27
修回日期: 2018-01-19
刊出日期: 2018-03-20

中图分类号: O572.21⁺2

关键词:

摘要: 介绍了一种基于THGEM的X射线光斑寻迹探测器，用于X射线单光子计量技术研究和测量，探测器有效面积200 mm×200 mm，采用128路基于ASIC和FPGA的高速读出电子学，探测器分为中间高分辨区和外围低分辨区两部分，两部分共用一套读出电子学。实验在中国计量科学研究院利用X光机产生的束线，测试光斑位置、光斑精细分布以及探测器的位置分辨。实验结果表明，探测器实现了同时对光斑寻迹和光斑的精细测量，探测器中间高分辨区x方向的位置分辨率为0.63 mm（FWHM），y方向位置分辨率为0.62mm（FWHM），探测器各项性能指标均达到了预期目标。

This paper introduces the detector of X-ray spot tracing based on the THGEM. It is used for X ray single photon measurement technology research and measurement with an effective area of 200 mm×200 mm. The circuit board has 128 array of high speed readout electronics based on ASIC and FPGA. And it is divided into two parts:the middle area of high sensitive and the peripheral area of low sensitive. The two parts share a set of readout electronics. The experiment tests the position and the fine structure of the beam line produced by X ray machine in National Institute of Metrology. The results of the experimental show that the detector realizes both the spot tracing and the fine structure of the spot. The position resolution is 0.63 mm in x direction and 0.62 mm in y direction in high sensitive of the detector, which achieve the desired goal of preliminary design.

English Abstract

Research on the X-ray Spot Tracing and the Position Resolution of THGEM Detector

1. Institute of High Energy Physics Chinese Academy of Sciences, Beijing 10049, China;

2. Centre of Excellence for Advanced Materials, Dongguan 523808, Guangdong, China;

3. Dongguan Neutron Science Center, Dongguan 523803, Guangdong, China;

4. State Key Laboratory of Particle Detection and Electronics, Beijing 100049, China;

5. School of Nuclear Science and Technology, University of South China, Hengyang 421000, Hunan, China;

6. National Institute of Metrology, Beijing 100029, China

Received Date: 2017-11-27
Rev Recd Date: 2018-01-19
Publish Date: 2018-03-20

Keywords:

Abstract: This paper introduces the detector of X-ray spot tracing based on the THGEM. It is used for X ray single photon measurement technology research and measurement with an effective area of 200 mm×200 mm. The circuit board has 128 array of high speed readout electronics based on ASIC and FPGA. And it is divided into two parts:the middle area of high sensitive and the peripheral area of low sensitive. The two parts share a set of readout electronics. The experiment tests the position and the fine structure of the beam line produced by X ray machine in National Institute of Metrology. The results of the experimental show that the detector realizes both the spot tracing and the fine structure of the spot. The position resolution is 0.63 mm in x direction and 0.62 mm in y direction in high sensitive of the detector, which achieve the desired goal of preliminary design.

引用本文:

Citation:

LIU Chuanfeng, ZHOU Xiaojuan, ZHOU Jianrong, LU Liming, ZHU Lin, HE Cong, TAN Yingying, XU Hong, XIE Yuguang, WANG Xiaodong, WU Jinjie, CHEN Yuanbo, SUN Zhijia. Research on the X-ray Spot Tracing and the Position Resolution of THGEM Detector[J]. Nuclear Physics Review, 2018, 35(1): 61-65. doi: 10.11804/NuclPhysRev.35.01.061