Abstract: Using ¹²⁹Xe²⁰⁺ ions with kinetic energy of 100~500 keV and 1.2~6.0 MeV respectively incident on the Ta target, the spectral lines of transition radiation are measured between complex electronic configurations of excited atoms or ions during the interaction of incident ions at different velocities with the Ta surface. The ultraviolet spectral lines of the deexcitation radiation from multiple high Rydberg states to low energy state 5p⁵(²P°_3/2)6s of Xe atoms are measured as the kinetic energy of Xe²⁰⁺ranges from 100 to 500 keV, the principal quantum number of valence electrons of Rydberg states is n = 15 , 13, 11, and 8, respectively. The results show that as the incident ion velocity increases, the single particle fluorescence yield of the the high Rydberg states spectral line of Xe atoms decreases. During this collision process, the single particle fluorescence yield increases of the spectral lines of the excited target atoms and ions with the increase of the incident ion velocity. When the ion kinetic energy increases to 1.2~6.0 MeV, the single particle yield of the Ta characteristic X-rays (M_α1, M_α2) increases with the velocity of the incident ions. When the kinetic energy of the incident ion is 6 MeV, the L X-ray spectra are measured of the Xe atom during the collision between Xe²⁰⁺and the target atom.