Single Event Effects Induced by Heavy Ion in Semiconductor Device
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摘要: 重离子引起的单粒子效应是威胁航天器安全的重要因素之一 ,利用加速器进行地面模拟是研究单粒子效应的重要手段 .概述了单粒子效应研究的历史和现状,讨论了单粒子效应研究的基本方法 ,最后简要介绍了在兰州重离子加速器上已开展的单粒子效应研究工作. Single event effects (SEE ′s) have been observed in semiconductor device in space since 1975. It has been verified from many spaceflight tests that single event effect induced by cosmic ray is one of the important sources of anomalies and malfunctions of spacecraft. Initially, a brief outline of space radiation environment is given. The history and recent trends were described, and basic methods and necessary facilities for SEE testing were also discussed. Finally, the research ...Abstract: Single event effects (SEE ′s) have been observed in semiconductor device in space since 1975. It has been verified from many spaceflight tests that single event effect induced by cosmic ray is one of the important sources of anomalies and malfunctions of spacecraft. Initially, a brief outline of space radiation environment is given. The history and recent trends were described, and basic methods and necessary facilities for SEE testing were also discussed. Finally, the research ...
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Key words:
- single event effect /
- radiation damage /
- soft error /
- accelerator simulation
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