Wavelength Dispersive Position Sensitive Spectrometer with a Flat Crystal and Its Applications

Hu Zhao-hui

doi:10.11804/NuclPhysRev.11.03.053

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Volume 11 Issue 3

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Article Navigation > Nuclear Physics Review > 1994 > 11(3): 53-57

Hu Zhao-hui. Wavelength Dispersive Position Sensitive Spectrometer with a Flat Crystal and Its Applications[J]. Nuclear Physics Review, 1994, 11(3): 53-57. doi: 10.11804/NuclPhysRev.11.03.053

Citation:

Hu Zhao-hui. Wavelength Dispersive Position Sensitive Spectrometer with a Flat Crystal and Its Applications[J]. Nuclear Physics Review, 1994, 11(3): 53-57. doi: 10.11804/NuclPhysRev.11.03.053

Wavelength Dispersive Position Sensitive Spectrometer with a Flat Crystal and Its Applications

doi: 10.11804/NuclPhysRev.11.03.053

Hu Zhao-hui

Institute of High Energy Physics; Academia Sinica; Beijing 100080

Received Date: 1900-01-01
Rev Recd Date: 1900-01-01
Publish Date: 1994-09-20

Abstract

The paper introduces a new detection technique being quickly developed──wavelength dispersive position sensitive spectrometer with a flat crystal in the area of low energy X-ray analysis, its basic principle, related technology and applications. The development prospects and the future study are also discussed.
- ray analysis,
- wavelength dispersive,
- postion sensitive spectrometer,
- position sensitive detector,
- position sensitive readout electronics
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沈阳化工大学材料科学与工程学院沈阳 110142

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