Associated Particle Imaging and Its Progress
doi: 10.11804/NuclPhysRev.16.01.066
- Received Date: 1900-01-01
- Rev Recd Date: 1900-01-01
- Publish Date: 1999-03-20
Abstract: The basic principles, important characteristics and recent progress of associated particle imaging were reviewed. Associated particle imaging is position sensitive. It can be used in position sensitive examinations, for instance, hidden explosive inspection in airfield custom examination, drug examination. It has an important perspective in application.
Citation: | Xu Si-da, Zhu Wei-bin. Associated Particle Imaging and Its Progress[J]. Nuclear Physics Review, 1999, 16(1): 66-68. doi: 10.11804/NuclPhysRev.16.01.066 |