Total Dose Dependence of SEE Sensitivities for Microprocessor 80C86 and Its Peripheral Chip 82C85

ZHANG Qing-xiang; YANG Zhao-ming

doi:10.11804/NuclPhysRev.19.01.070

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Article Navigation > Nuclear Physics Review > 2002 > 19(1): 70-72

ZHANG Qing-xiang, YANG Zhao-ming. Total Dose Dependence of SEE Sensitivities for Microprocessor 80C86 and Its Peripheral Chip 82C85[J]. Nuclear Physics Review, 2002, 19(1): 70-72. doi: 10.11804/NuclPhysRev.19.01.070

Citation:

ZHANG Qing-xiang, YANG Zhao-ming. Total Dose Dependence of SEE Sensitivities for Microprocessor 80C86 and Its Peripheral Chip 82C85[J]. Nuclear Physics Review, 2002, 19(1): 70-72. doi: 10.11804/NuclPhysRev.19.01.070

Total Dose Dependence of SEE Sensitivities for Microprocessor 80C86 and Its Peripheral Chip 82C85

doi: 10.11804/NuclPhysRev.19.01.070

Received Date: 1900-01-01
Rev Recd Date: 1900-01-01
Publish Date: 2002-03-20

Abstract

Total dose dependence of the single event effct (SEE) sensitivity for microprocessor 80C86 and its peripheral chip 82C85 are reported. In this study, 1 μCi 252 Cf was used as a heavy ion simulator and the samples were tested by a patent 8086 test system following exposure to 60 Co γ rays. It is found that SEE cross section of 80C86 does not show significant change with increasing total dose from 0-120 Gy(Si). SEE test also shows that single event transient (SET) in 82C85...
- single event effect,
- total dose effect,
- microprocessor,
- peripheral chip
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通讯作者: 陈斌, bchen63@163.com

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沈阳化工大学材料科学与工程学院沈阳 110142

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