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Volume 23 Issue 2
Jun.  2006
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HUANG Wei, HAN Jun, XU Yun-shu, FU Yi-bei, HE Jie. Study on Radiation Effect of Polytetrofluoroethylene Sealing Material Irradiated by Electron Beam[J]. Nuclear Physics Review, 2006, 23(2): 180-184. doi: 10.11804/NuclPhysRev.23.02.180
Citation: HUANG Wei, HAN Jun, XU Yun-shu, FU Yi-bei, HE Jie. Study on Radiation Effect of Polytetrofluoroethylene Sealing Material Irradiated by Electron Beam[J]. Nuclear Physics Review, 2006, 23(2): 180-184. doi: 10.11804/NuclPhysRev.23.02.180

Study on Radiation Effect of Polytetrofluoroethylene Sealing Material Irradiated by Electron Beam

doi: 10.11804/NuclPhysRev.23.02.180
  • Received Date: 1900-01-01
  • Rev Recd Date: 1900-01-01
  • Publish Date: 2006-06-20
  • The radiation effect of polytetrafluoroethylene used as a kind of sealing material in the tritium system was studied by using electron beam. The superficial configuration and state were analyzed by SEM and XPS respectively, and the crystal degree and thermal stability were determined by XRD and DSC. At the same time the composition of gas products after radiation ,was measured by GC/MS, and the yield of CO2 with the dose increasing was analyzed. The free radicals produced in the process of radiation were studied by ESR, and the content of free volume of PTFE is analyzed by positron annihilation lifetime spectroscopy. The result is that the crystal structure of the sample irradiated at the dose of 1 × 10^5 Gy is of an obvious damage while the structure of the unirradiated sample is crystal band. The transformation of the sample which has high crystal degree amorphous one. The melting point and thermal ecomposition temperature trend sample's thermal stability drops. The radiation decomposition of the sample is is remarkable from crystal state to to decline, which indiccates that the mainly the rupture of C--C bond, and less is the rupture of C--F bond. The Intensity I3 of the third lifetime fails with increasing the absorbed dose, which demonstrates the reduction of free volume cave content. Compared with I3, the rule of τ3 is reverse.
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    沈阳化工大学材料科学与工程学院 沈阳 110142

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Study on Radiation Effect of Polytetrofluoroethylene Sealing Material Irradiated by Electron Beam

doi: 10.11804/NuclPhysRev.23.02.180

Abstract: The radiation effect of polytetrafluoroethylene used as a kind of sealing material in the tritium system was studied by using electron beam. The superficial configuration and state were analyzed by SEM and XPS respectively, and the crystal degree and thermal stability were determined by XRD and DSC. At the same time the composition of gas products after radiation ,was measured by GC/MS, and the yield of CO2 with the dose increasing was analyzed. The free radicals produced in the process of radiation were studied by ESR, and the content of free volume of PTFE is analyzed by positron annihilation lifetime spectroscopy. The result is that the crystal structure of the sample irradiated at the dose of 1 × 10^5 Gy is of an obvious damage while the structure of the unirradiated sample is crystal band. The transformation of the sample which has high crystal degree amorphous one. The melting point and thermal ecomposition temperature trend sample's thermal stability drops. The radiation decomposition of the sample is is remarkable from crystal state to to decline, which indiccates that the mainly the rupture of C--C bond, and less is the rupture of C--F bond. The Intensity I3 of the third lifetime fails with increasing the absorbed dose, which demonstrates the reduction of free volume cave content. Compared with I3, the rule of τ3 is reverse.

HUANG Wei, HAN Jun, XU Yun-shu, FU Yi-bei, HE Jie. Study on Radiation Effect of Polytetrofluoroethylene Sealing Material Irradiated by Electron Beam[J]. Nuclear Physics Review, 2006, 23(2): 180-184. doi: 10.11804/NuclPhysRev.23.02.180
Citation: HUANG Wei, HAN Jun, XU Yun-shu, FU Yi-bei, HE Jie. Study on Radiation Effect of Polytetrofluoroethylene Sealing Material Irradiated by Electron Beam[J]. Nuclear Physics Review, 2006, 23(2): 180-184. doi: 10.11804/NuclPhysRev.23.02.180

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