Investigation of Intermixing and Phase Change of Ni/SiO2 under Swift Heavy Ion Irradiation
doi: 10.11804/NuclPhysRev.26.01.044
- Received Date: 1900-01-01
- Rev Recd Date: 1900-01-01
- Publish Date: 2009-03-20
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Key words:
- swift heavy ion irradiation /
- intermixing and phase change /
- RBS /
- XRD
Abstract: Ni/SiO2 interface were irradiated at room temperature with 308 MeV Xe ions to 1×1012, 5×1012 Xe/cm2 and 853 MeV Pb ions to 5×1011 Pb/cm2, respectively. These samples were analyzed using Rutherford Backscattering Spectrometry (RBS) and Xray diffraction spectroscopy (XRD), from which the intermixing and phase change were investigated. The obtained results show that both Xe and Pbions could induce diffusion of Ni atoms to SiO2 substrates and result in intermixing of Ni with SiO2. Furthermore, 1.0×1012 Xe/cm2 irradiation induced the formation of NiSi2 and 5.0×1012 Xe/cm2 irradiation created Ni3Si and NiO phases. The diffusion of Ni atoms and the formation of new phase may be driven by a transient thermal spike process induced by the intense electronic energy loss along the incident ion path.
Citation: | LIU Chun-bao, WANG Zhi-guang, #, WEI Kong-fang, ZANG Hang, YAO Cun-feng, MA Yi-zhun, SHENG Yan-bin, GOU Jie, JIN Yun-fan, A.Benyagoub, M.Toulemonde. Investigation of Intermixing and Phase Change of Ni/SiO2 under Swift Heavy Ion Irradiation[J]. Nuclear Physics Review, 2009, 26(1): 44-47. doi: 10.11804/NuclPhysRev.26.01.044 |