Development of a Four-dimensional Emittance Meter for the Diagnostics of High Intensity Highly Charged Ion Beam From an Electron Cyclotron Resonance Ion Source

FANG Xing; SUN Liangting; YUAN Youjinjin; QIAN Cheng; CHEN Ruofu; WU Junxia

doi:10.11804/NuclPhysRev.36.03.313

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FANG Xing, SUN Liangting, YUAN Youjinjin, QIAN Cheng, CHEN Ruofu, WU Junxia. Development of a Four-dimensional Emittance Meter for the Diagnostics of High Intensity Highly Charged Ion Beam From an Electron Cyclotron Resonance Ion Source[J]. Nuclear Physics Review, 2019, 36(3): 313-321. doi: 10.11804/NuclPhysRev.36.03.313

Citation:

FANG Xing, SUN Liangting, YUAN Youjinjin, QIAN Cheng, CHEN Ruofu, WU Junxia. Development of a Four-dimensional Emittance Meter for the Diagnostics of High Intensity Highly Charged Ion Beam From an Electron Cyclotron Resonance Ion Source[J]. Nuclear Physics Review, 2019, 36(3): 313-321. doi: 10.11804/NuclPhysRev.36.03.313

Development of a Four-dimensional Emittance Meter for the Diagnostics of High Intensity Highly Charged Ion Beam From an Electron Cyclotron Resonance Ion Source

doi: 10.11804/NuclPhysRev.36.03.313

1.
Institute of Modern Physics, Chinese Academy of Science, Lanzhou 730000, China;
2.
School of Nuclear Science and Technology, University of Chinese Academy of Sciences, Beijing 100049, China

Funds: National Natural Science Foundation of China(11427904, 11575265)

Received Date: 2019-04-14
Rev Recd Date: 2019-06-11
Publish Date: 2019-09-20

Abstract

To study the four-dimensional (4D) emittances of the ion beams extracted from a highly charged ion source, so as to improve the ion beam coupling efficiency to downstream accelerators, a Pepper Pot type emittance probe PEMiL (Pepper pot Emittance Meter in Lanzhou) has been developed at Institute of Modern Physics (IMP). Based on the application requirements, the typical parameters of PEMiL have been refined. In the development, we utilized a quartz glass target sprayed uniformly with KBr powder as the scintillator instead of the traditional CsI scintillator to mitigate the overlapping effect of ion beam spot images, which has been validated with the measured results that the beam spot overlapping error vanishes and clear boundary spots has been obtained. For this 4D emittance probe, corresponding data processing and analyzing code has also been developed, so as to give the detailed transverse beam quality information of the incident beam in 4D phase space. In this paper, we will present the technical details about the structure design, fabrication and data processing of PEMiL. The preliminary test results of a 75 keV, 170 eμA O⁵⁺ beam emittance will also be measured. The analysis results show that beam emittance measured by PEMiL reveals a high reliability, the emittance difference that was caused by the charge accumulation effect of scintillator is lower than 25%, and PEMiL can be used as an efficient meter for the ECR ion source extracted beam property diagnostic.
- ion source,
- coupling,
- 4D emittance,
- Pepper Pot,
- overlapping

References

[1]	ZHAO H W, SUN L T, ZHANG X Z, et al. Review of Scientific Instruments, 2006, 77(3):03A333.
[2]	LEITNER D, LYNEIS C M, LOEW T, et al. Review of Scientific Instruments, 2006, 77(3):03A302.
[3]	NAKAGAWA T, YANO Y. Review of Scientific Instruments, 2000, 71(2):637.
[4]	GIRARD A, MELIN G. Nucl Instr and Meth A, 1996, 382(1-2):252.
[5]	YANG Y, YUAN Y J, SUN L T, et al. Review of Scientific Instruments, 2014, 85(11):113305.
[6]	SUN L T, LU W, YANG Y, et al. ECRIS Developments Towards Intense High Brightness Highly-charged Ion Beams[C]//McCausey A and Schaa V ed. Proceedings of HB2014. USA:Michigan State University. 2014:363.
[7]	ZHAO H W. Beam Emittance Measurement on HIRFL[M]. Lanzhou:Institute of Modern Physics, Chinese Academy of Sciences, 1991(4):37. (in Chinese) (赵红卫. HIRFL束流发射度测量[M]. 兰州:中国科学院近代物理研究所, 1991(4):37)
[8]	REN H T, PENG S X, ZHAO J, et al. A Non-Intercepting Beam Emittance Measurement Device Based on Neutral Beam Fluorescence Method at PKU[C]. Ian Martin and Guenther Rehm ed. Proceeding of IBIC2013, UK:Oxford. 2013:522.
[9]	YU L D, ZHAO J X, SUI Y F, et al. Design and Application of Double-slit Emittance Meter for C-ADS Proton Beams[C]//CHRISTINE P, KIM D E, KIM K S, et al. ed. Proceedings of IPAC2016, Busan, Korea. 2016:164.
[10]	POGGE F J, SNS Emittance Scanner, Increasing Sensitivity and Performance Through Noise Mitigation, Design, Implementation and Results[C]//Meyer T S and Webber R C ed. Proceedings of Beam Instrument Workshop. USA:Oak Ridge National Laboratory. 2006:435.
[11]	ZHANG A L, REN H T, PENG S X et al. Chinese Physics B, 2018, 27(2):025205.
[12]	STOCKLI M P, WELTON R F, KELLER R, et al. Review of Scientific Instruments. 2006, 77(3):03B706.
[13]	CAO Y, ZHAO H W, MA L, et al. Review of Scientific Instruments, 2004, 75(5):1443.
[14]	XIAO C, MAIER M, DU X N, et al. Physical Review Accelerators and Beams, 2016, 19:072802.
[15]	STOCKLI M P. Measuring and Analyzing the Transverse Emittance of Charged Particle Beams[C]//MEYER T S, WEBBER R C ed. Proceedings of Beam Instrument Workshop. USA:Oak Ridge National Laboratory. 2006:25.
[16]	STROHMEIER M, BENITEZ J Y, LEITNER D, et al. Review of Scientific Instruments, 2010, 81(2):02B710.
[17]	DOMKE M, DORN C, FORCK P, et al. A Single Shot Emittance Measuring System for Intense Heavy Ion Beams[C]//GHIGO A, GIABBAI M, POSSANZA M, ed. European Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators, Italy:Frascati. 1997:141.
[18]	KONDRASHEV S, BARCIKOWSKI A, MUSTAPHA B, et al. Nucl Instr and Meth A, 2009, 606(3):296.
[19]	NAGATOMO T, TZOGANIS V, KASE M, et al. Review of Scientific Instruments, 2016, 87(2):02B920.
[20]	KREMERS H R, BEIJERS J P M, BRANDENBURG S. Review of Scientific Instruments, 2013, 84(2):025117.
[21]	LU W. Design, Construction and Optimization of High-B Mode Ecr Ion Sources[D]. Beijng:University of Chinese Academy of Sciences, 2013(10):100. (in Chinese) (卢旺. High-B模式ECR源的设计、研制及优化[D]. 兰州:中国科学院近代物理研究所, 2013(10):100.)
[22]	ZHANG X H, YUAN Y J, YIN X J, et al. Analyzing and Matching Study of Mixed High Intensity Highly Charged Ion Beams[C]//ESHRAQI M ed. Proceedings of the 57th ICFA Advanced Beam Dynamics Workshop on High-Intensity, High Brightness and High Power Hadron Beams. Sweden:European Spallation Source. 2016:422.

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通讯作者: 陈斌, bchen63@163.com

1.
沈阳化工大学材料科学与工程学院沈阳 110142

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Development of a Four-dimensional Emittance Meter for the Diagnostics of High Intensity Highly Charged Ion Beam From an Electron Cyclotron Resonance Ion Source

1. Institute of Modern Physics, Chinese Academy of Science, Lanzhou 730000, China;

2. School of Nuclear Science and Technology, University of Chinese Academy of Sciences, Beijing 100049, China

Funds: National Natural Science Foundation of China(11427904, 11575265)

Received Date: 2019-04-14

Rev Recd Date: 2019-06-11

Publish Date: 2019-09-20

Key words:

Abstract: To study the four-dimensional (4D) emittances of the ion beams extracted from a highly charged ion source, so as to improve the ion beam coupling efficiency to downstream accelerators, a Pepper Pot type emittance probe PEMiL (Pepper pot Emittance Meter in Lanzhou) has been developed at Institute of Modern Physics (IMP). Based on the application requirements, the typical parameters of PEMiL have been refined. In the development, we utilized a quartz glass target sprayed uniformly with KBr powder as the scintillator instead of the traditional CsI scintillator to mitigate the overlapping effect of ion beam spot images, which has been validated with the measured results that the beam spot overlapping error vanishes and clear boundary spots has been obtained. For this 4D emittance probe, corresponding data processing and analyzing code has also been developed, so as to give the detailed transverse beam quality information of the incident beam in 4D phase space. In this paper, we will present the technical details about the structure design, fabrication and data processing of PEMiL. The preliminary test results of a 75 keV, 170 eμA O⁵⁺ beam emittance will also be measured. The analysis results show that beam emittance measured by PEMiL reveals a high reliability, the emittance difference that was caused by the charge accumulation effect of scintillator is lower than 25%, and PEMiL can be used as an efficient meter for the ECR ion source extracted beam property diagnostic.

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Reference (22)

[1]	ZHAO H W, SUN L T, ZHANG X Z, et al. Review of Scientific Instruments, 2006, 77(3):03A333.
[2]	LEITNER D, LYNEIS C M, LOEW T, et al. Review of Scientific Instruments, 2006, 77(3):03A302.
[3]	NAKAGAWA T, YANO Y. Review of Scientific Instruments, 2000, 71(2):637.
[4]	GIRARD A, MELIN G. Nucl Instr and Meth A, 1996, 382(1-2):252.
[5]	YANG Y, YUAN Y J, SUN L T, et al. Review of Scientific Instruments, 2014, 85(11):113305.
[6]	SUN L T, LU W, YANG Y, et al. ECRIS Developments Towards Intense High Brightness Highly-charged Ion Beams[C]//McCausey A and Schaa V ed. Proceedings of HB2014. USA:Michigan State University. 2014:363.
[7]	ZHAO H W. Beam Emittance Measurement on HIRFL[M]. Lanzhou:Institute of Modern Physics, Chinese Academy of Sciences, 1991(4):37. (in Chinese) (赵红卫. HIRFL束流发射度测量[M]. 兰州:中国科学院近代物理研究所, 1991(4):37)
[8]	REN H T, PENG S X, ZHAO J, et al. A Non-Intercepting Beam Emittance Measurement Device Based on Neutral Beam Fluorescence Method at PKU[C]. Ian Martin and Guenther Rehm ed. Proceeding of IBIC2013, UK:Oxford. 2013:522.
[9]	YU L D, ZHAO J X, SUI Y F, et al. Design and Application of Double-slit Emittance Meter for C-ADS Proton Beams[C]//CHRISTINE P, KIM D E, KIM K S, et al. ed. Proceedings of IPAC2016, Busan, Korea. 2016:164.
[10]	POGGE F J, SNS Emittance Scanner, Increasing Sensitivity and Performance Through Noise Mitigation, Design, Implementation and Results[C]//Meyer T S and Webber R C ed. Proceedings of Beam Instrument Workshop. USA:Oak Ridge National Laboratory. 2006:435.
[11]	ZHANG A L, REN H T, PENG S X et al. Chinese Physics B, 2018, 27(2):025205.
[12]	STOCKLI M P, WELTON R F, KELLER R, et al. Review of Scientific Instruments. 2006, 77(3):03B706.
[13]	CAO Y, ZHAO H W, MA L, et al. Review of Scientific Instruments, 2004, 75(5):1443.
[14]	XIAO C, MAIER M, DU X N, et al. Physical Review Accelerators and Beams, 2016, 19:072802.
[15]	STOCKLI M P. Measuring and Analyzing the Transverse Emittance of Charged Particle Beams[C]//MEYER T S, WEBBER R C ed. Proceedings of Beam Instrument Workshop. USA:Oak Ridge National Laboratory. 2006:25.
[16]	STROHMEIER M, BENITEZ J Y, LEITNER D, et al. Review of Scientific Instruments, 2010, 81(2):02B710.
[17]	DOMKE M, DORN C, FORCK P, et al. A Single Shot Emittance Measuring System for Intense Heavy Ion Beams[C]//GHIGO A, GIABBAI M, POSSANZA M, ed. European Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators, Italy:Frascati. 1997:141.
[18]	KONDRASHEV S, BARCIKOWSKI A, MUSTAPHA B, et al. Nucl Instr and Meth A, 2009, 606(3):296.
[19]	NAGATOMO T, TZOGANIS V, KASE M, et al. Review of Scientific Instruments, 2016, 87(2):02B920.
[20]	KREMERS H R, BEIJERS J P M, BRANDENBURG S. Review of Scientific Instruments, 2013, 84(2):025117.
[21]	LU W. Design, Construction and Optimization of High-B Mode Ecr Ion Sources[D]. Beijng:University of Chinese Academy of Sciences, 2013(10):100. (in Chinese) (卢旺. High-B模式ECR源的设计、研制及优化[D]. 兰州:中国科学院近代物理研究所, 2013(10):100.)
[22]	ZHANG X H, YUAN Y J, YIN X J, et al. Analyzing and Matching Study of Mixed High Intensity Highly Charged Ion Beams[C]//ESHRAQI M ed. Proceedings of the 57th ICFA Advanced Beam Dynamics Workshop on High-Intensity, High Brightness and High Power Hadron Beams. Sweden:European Spallation Source. 2016:422.

Development of a Four-dimensional Emittance Meter for the Diagnostics of High Intensity Highly Charged Ion Beam From an Electron Cyclotron Resonance Ion Source

doi: 10.11804/NuclPhysRev.36.03.313

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References

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通讯作者: 陈斌, bchen63@163.com

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