[1] |
TAKAHASHI K, KUZUMOTO M, MATSUMOTO Y, et al. Review of Scientific Instruments, 2020, 91: 033310. |
[2] |
OKAMURA M, SEKINE M, IKEDA S, et al. Laser and Particle Beams, 2015, 33: 137. |
[3] |
SEKINE M, IKEDA S, ROMANELLI M, et al. Nucl Instr and Meth A, 2015, 795: 151. |
[4] |
PEACOCK N J, PEASE R S. Journal of Physics D: Applied Physics, 1969, 2: 1705. |
[5] |
GAMMINO S, TORRISI L, CAVALLARO S, et al. Review of Scientific Instruments, 2010, 81: 02A508. |
[6] |
YEATES P, COSTELLO J T, KENNEDY E T. Review of Scientific Instruments, 2010, 81: 043305. |
[7] |
GASIOR P.Can ICAN can CERN into a can: Review Study[C]//Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2013, October 23, 2013, Wilga, Poland. Bellingham: SPIE, 2013: 89030N. |
[8] |
IKEDA S, KUMAKI M, KANESUE T, et al. Review of Scientific Instruments, 2016, 87: 02A915. |
[9] |
SAKO T, YAMAGUCHI A, SATO K, et al. Review of Scientific Instruments, 2016, 87: 02C109. |
[10] |
ALNAIMI R. Time of Flight in Electrostatic Ion Analyser for Laser Produced Plasma ion Resolving[C]//Proc SPIE 11032, EUV and X-ray Optics: Synergy between Laboratory and Space VI, April 26, 2019, Prague, Czech Republic. Bellingham: SPIE, 2019: 11032K. |
[11] |
ALNAIMI R. Journal of Instrumentation, 2017, 12: 6001. |
[12] |
ROSINSKI M, BADZIAK J, BOODY F P, et al. Vacuum, 2005, 78: 435. |
[13] |
BALABAEV A, KONDRASHEV S, KONUKOV K, et al. Review of Scientific Instruments, 2004, 75: 1572. |
[14] |
ZHAO Huanyu, ZHANG Junjie, JIN Qianyu, et al. Review of Scientific Instruments, 2016, 87: 02A917. |
[15] |
FOURNIER P, GREGOIRE G, KUGLER H, et al. Review of Scientific Instruments, 2000, 71: 924. |
[16] |
KONDRASHEV S, MESCHERYAKOV N, SHARKOV B, et al. Review of Scientific Instruments, 2000, 71: 1409. |
[17] |
OKAMURA M, ADEYEMI A, KANESUE T, et al. Review of Scientific Instruments, 2010, 81: 02A510. |
[18] |
WANG Guicai, ZHAO Huanyu, JIN Qianyu, et al. Review of Scientific Instruments, 2019, 90: 113302. |
[19] |
BROWN I G, The Physics and Technology of Ion Sources [M]. Weinheim : Wiley-VCH Verlag GmbH & Co KGaA, 2004. |
[20] |
BADZIAK J, PARYS P, VANKOV A B, et al. Applied Physics Letters, 2001, 79: 21. |